Abstract
Object recognition-based estimation of planogram compliance provides an expected arrangement of products on shelves. Identifying whether a product is placed in an appropriate location on a shelf is a challenging task due to various real-time parameters associated with image capturing. In the present disclosure, an input image associated with a shelf of a retail store is received and product images are cropped. Further, a set of reference images stored in a database are scaled corresponding to the input image. Further, one or more composite matching scores are calculated based on normalized cross-correlation and shape-based feature matching to obtain one or more probable product images associated with a location. Further, a Directed Acyclic Graph (DAG) is constructed based on one or more composite scores and one or more probable products. Finally, an optimal matching product image for a particular location is obtained from the DAG.
Document Type
Patent
Patent Number
US10748030B2
Assignee
Tata Consultancy Services Limited
Application Number
US16/307,409
Date Filed
12-10-2017
Date Issued
8-18-2020
Corrections
no
Recommended Citation
Hari, Pranoy; Rao, Shilpa Yadukumar; Ramakrishnan, Rajashree; Shaw, Avishek Kumar; Ray, Archan; Kumar, Nishant; and Mukherjee, Dipti Prasad, "System and method for object recognition based estimation of planogram compliance" (2020). Patents. 2.
https://digitalcommons.isical.ac.in/patents/2
Included in
Computer Engineering Commons, Electronic Devices and Semiconductor Manufacturing Commons
Comments
CROSS-REFERENCE TO RELATED PATENT APPLICATIONS: The present application is a national phase under 35 U.S.C. § 371 of International Application No. PCT/IB2017/056318, filed Oct. 12, 2017, which claims priority to Indian Application No. 201621034860, filed in India on Oct. 12, 2016, both of which are hereby incorporated by reference in their entireties.
TECHNICAL FIELD: The embodiments herein generally relate, in general, to planogram compliance and, in particular, to a system and method for object recognition-based estimation of planogram compliance.