A synoptic study on fault testing in reversible and quantum circuits

Document Type

Conference Article

Publication Title

Smart Innovation, Systems and Technologies

Abstract

Reversible computation, whose special class is quantum computation, arises from the desire to reduce power dissipation, which can be zero under ideal physical circumstances. Nowadays, error correction and fault testing are of utmost importance for the physical implementation of reversible and quantum circuits in a noisy environment. In this paper, we review various fault models in reversible and quantum circuits. In classical reversible circuits, we review (i) test pattern generation for Single Missing Gate Fault (SMGF), Partial Missing Gate Fault (PMGF), and Multiple Missing Gate Fault (MMGF) models and (ii) show that Universal Test Set (UTS) can be used to detect any of these faults. However, classical fault models do not capture all the logical failures found in quantum circuits. In quantum circuits, we review (i) depolarizing faults, initialization inaccuracy and measurement inaccuracy, and (ii) give some remedial strategies to deal with these fault models. Finally, we show that for a special class of quantum operators, detection of SMGF is sufficient to detect fault due to multiple occurrences of the gate also. Further, we argue with an example that it may not be possible to generate test patterns to detect any arbitrary SMGF in a quantum circuit.

First Page

23

Last Page

38

DOI

10.1007/978-981-10-8102-6_2

Publication Date

1-1-2018

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