Date of Submission


Date of Award


Institute Name (Publisher)

Indian Statistical Institute

Document Type

Doctoral Thesis

Degree Name

Doctor of Philosophy

Subject Name



Theoretical Statistics and Mathematics Unit (TSMU-Kolkata)


Mukhopadhyay, Anis Chandra (TSMU-Kolkata; ISI)

Abstract (Summary of the Work)

The wide acceptance of Statistics as a basic tool in technölogical growth, later recog- nised as a Key technology, gained ground with the pioneering work of Shewhart in 20s, introducing Statistical Quality Control (SQC) in manufacturing industry. Around the same time a solid statistical basis was being worked out for the ageold concepts of sampling inspection for industrial products. By 1930, acceptance sam- pling for lot by lot inspection was being applied in Western Electric Company and elsewhere. Since then statistical tools have been the major technical inputs of To- tal Quality Management which has spread far and wide as a movement for better customer satisfaction as well as reduced loss and cost for manufacturing industries. Statistical techniques may be broadly used in industry for (i) Process Control (ii) Acceptance Sampling for Quality Evaluation and Assurance (iii) Special in-depth studies with a view to achieving Process Improvement and (iv) Design and Planning of Industrial Experimentation for optimal determination of factor combinations for a breakthrough.In our present work we have mainly dealt with (a) selection of Optimum Continuous Sampling plans that minimise the amount of inspection when the incoming process quality is maintained at a desirable level.We have also studied a few topics of interest such as (b) computation of Tolerance Factor A (c) institution of Gauge Control chart (d) determination of Optimum Inspection Interval for controlling wastes of a high speed printing machine and (e) assessment of the effect of Inspection Error on lot by lot acceptance rectification inspection, covering ranges of application in the domains of quality evaluation, process control and quality assurance.1.1 Introduction to CSP PlansSeveral authors have enriched the field of Continuous Sampling Plan since the publication of CSP - 1 by Dodge (1943). A first comprehensive review of the work was made by Bowker (1956). This has been updated properly from time to time by various authors including Lieberman (1965), Phillips (1969), Banzhof and Brugger (1970), Wetherill (1977) and Stephens (1979). Close on the heels along with Dodge, Wald and Wolfowitz (1945) introduced SPA plans which, unlike CSP - 1, start with sampling inspection first and change to cent per cent inspection whenever required. The authors also modified SPA to SPB; several other related modifications were later introduced by Sahani (1979).Dodge and Torrey (1951) in their plans, CSP - 2 and CSP - 3 suggested some modifications over CSP 1 regarding return to cent per cent inspection from the sampling inspection phase. Derman, Johns and Lieberman (1959) considered fur- ther modifications and proposed CSP - 4 and CSP - 5. Lieberman and Solomon (1955) introduced a major change in the operating rules of CSPs by suggesting Multilevel Sampling Plans (MLP) introducing two to an infinite number of levels of inspection. Read and Beattie (1961) introduced the concept of variable lot size in the same context. In industry, however, Dodge type CSP plans became popular largely due to its adoption by US Army Ordnance Corps in the early fifties for inspection of ammuni- tion components, aircraft engines and propellers.


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This work is licensed under a Creative Commons Attribution 4.0 International License.


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